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SPM sample mounting disks
702A 115mm carbon fiber reinforced PVDF 2
75 SiC / 1
6H-SiC (0001) based calibration sample which is designed to perform easy calibrations of an AFM scanner's vertical movements in several nanometers interval
5µm Accuracy 0
PELCO® 400 Mesh Special Metal Grids PTFE coated SS SPM sample mounting disksDESCRIPTION SIZE SPECIFICATIONS METAL PURITY SPECIFICATIONS for transmission electron microscopy packed in anti static vials useful for EDX analysis, high temperature and cryo applications packed in anti static vials These grids are available in molybdenum, titanium, aluminum and stainless steel 316. The grids are made by a high precision etching process. The thickness is approximately 25m for Mo and Al, 15m for Ti and 12m for stainless steel. The
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