Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration This CD calibration test specimen

This CD calibration test specimen comprises 5 line patterns

For personal use a more delicate scribe with a finer tip but a sturdy shaft and broad base (90º included angle) would be Product 54483 or 54484 depending on the scribe head angle desired

Optical Microscopy - transmitted

specially formulated adhesive for demanding bonding applications such as:

Typical applications for these tweezers include microscopy preparation

Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration This CD calibration test specimenDESCRIPTION These light weight tweezers and pliers are non absorbent, have a positive, gentle grip, are non magnetic and the tips do not open when extra pressure is applied. They resist acetone, alcohol and most acids. Static dissipative (carbon fiber reinforced) versions are available for most models. Ideal for sample preparation, microscopy, etching, electronics, instrumentation, laboratories, forensics and delicate wafer handling. Especially useful